Measuring and testing technology

Measuring and testing technology for power electronics

Automated semiconductor test bench
© Fraunhofer IEE
Automated semiconductor test bench (v1)
Calorimetric test bench
© Fraunhofer IEE
Calorimetric test bench

The selection of suitable components and testing their function in the application is an essential part of any development of power electronic systems. The more powerful and efficient a system is to be, the more important it is to have precise knowledge of the operating behavior of the components used and their interaction in order to avoid expensive and time-consuming troubleshooting or repairs and to ensure planned operation.

Thanks to our extensive experience in the field of measurement and testing technology for power electronic components and systems, we can support you efficiently and reliably even with the most complex tasks. The consideration of new technologies (SiC, GaN), the increased integration of renewable energy systems by means of converters and the associated issues of their reliable and grid-compliant operation are among the core competencies of our institute. We have many successful projects in precisely this field of tension, and we are happy to offer you our knowledge and experience to make your products fit for the energy system of the future.

Benefit from our knowledge and our laboratory and measurement services for the entire development process of power electronic systems - from the selection, design and optimization of system components to their integration and commissioning through to validation in the field. Our experts will be happy to advise you.

EMC lab

Measurements on electricity meters
© Fraunhofer IEE
Measurements on electricity meters

Electromagnetic compatibility is a basic prerequisite for the fault-free operation of power electronic components in the electrical grid. In addition to standard-compliant measurements, customer-specific investigations in the time and frequency range can help to uncover deficits and understand the interaction between the interference source and interference sink. One example of this is the interference of electricity meters by pulsed power converters, which can result in measurement errors to the detriment of the customer or the grid operator.

Photovoltaic test field

Outdoor measuring station for photovoltaic modules with PID load
© Fraunhofer IEE
Outdoor measuring station for photovoltaic modules with PID load
Outdoor measuring station for surface potentials
© Fraunhofer IEE
Outdoor measuring station for surface potentials

For 25 years, Fraunhofer IEE has been measuring photovoltaic components under realistic conditions in the open field. In addition to recording characteristic curves or maximum power point values, there is a wide range of measurement options for gaining experience of the long-term behavior, degradation and yield of photovoltaic products. Examples include investigations into the behavior of photovoltaic modules when exposed to potentials (potential-induced degeneration, PID) and the recording of surface potentials on the glass surface of PV modules.

Current research projects

BMWK, 08/2023 - 07/2026

PV4Life

Increasing the service life of power converters through component optimization using digital AI twins

BMWK, 05/2021 - 04/2024

GaN-HighPower

Cost- and weight-efficient high-power PV and battery inverters for international markets of the future thanks to gallium nitride (GaN) semiconductors

BMWK, 05/2019 - 04/2022

PV-Move

Methods, processes and components for reducing switching losses in fast-cycling PV power converters for targeted weight and cost reduction

BMWK, 01/2018 - 04/2021

PID-Recovery

Research into the regeneration capacity and derivation of yield forecasts with regard to potential-induced degradation for installed silicon solar modules

BMWK, 01/2019 - 12/2021

F-Hil

Avoidance of high-frequency interference in converter-dominated grids

BMWK, 10/2019 - 06/2023

MUSiCel

Research into the regeneration capacity and derivation of yield forecasts with regard to potential-induced degradation for installed silicon solar modules